Product Overview

The PDL-1000 is a specialized analytical platform designed to solve the measurement challenges of next-generation materials with extremely low signal-to-noise ratios.

Hall measurement is a fundamental technique for determining carrier type, density, and mobility in electronic materials. However, traditional DC systems often fail when characterizing low-mobility thin films, high-resistance samples, or extremely low-resistance metals because the resulting Hall voltage is buried under thermal noise and parasitic offsets. The PDL-1000 overcomes these limitations by utilizing a unique AC magnetic field generated by a Parallel Dipole Line (PDL) configuration. By modulating the field at a specific frequency and using synchronous detection, the system effectively "filters out" noise, allowing researchers to accurately characterize materials with mobility levels significantly below 0.1 cm²/Vs—a feat previously considered nearly impossible in laboratory settings.
Quick Specifications
Mobility Range Able to handle < 0.1 cm²/Vs
Magnetic Field ~2.5 T pk-pk (AC Field)
Field Uniformity < 2% over 10x10 mm area
Operating Modes AC and DC Hall Measurement
Form Factor Compact Tabletop System
Software Proprietary UI with Auto-Extraction

Key Features

AC Field PDL Technology

Utilizes a rotating parallel dipole line to generate high-intensity oscillating magnetic fields, which is the core innovation for high-sensitivity detection.

  • Enables high-resolution measurement of mobility < 0.1 cm²/Vs
  • Eliminates thermal drift and offset voltages through AC modulation
  • Produces a large, consistent peak-to-peak field of ~2.5 T

Proprietary Signal Processing

Features advanced software algorithms and hardware integration designed to extract valid signals from extremely noisy environments.

  • Integrated Lock-in amplification for synchronous signal detection
  • Sophisticated background subtraction for highly resistive films
  • Real-time visualization of Hall coefficients and voltage curves

Automation & Integration

Designed for professional research environments where reproducibility and ease of use are paramount for data validation.

  • Fully automated parameter extraction for Carrier Density and Mobility
  • Software-controlled gate bias voltage option for FET characterization
  • Built-in contact verification to ensure measurement integrity

Research-Grade Precision

A compact tabletop solution that delivers the performance of large superconducting magnets without the associated costs or space requirements.

  • Exceptional field uniformity (< 2%) across the entire measurement area
  • Low-maintenance design suitable for multi-user academic and industrial labs
  • Versatile sample handling for semiconductors, thermoelectrics, and PVs

Technical Specifications

Technical Parameter Specification Detail
Minimum Mobility Limit < 0.1 cm²/Vs (Industry-leading sensitivity)
Magnetic Field Strength (AC) ~ 2.5 T pk-pk (Enables strong signal modulation)
Field Uniformity < 2% (Maintained for sample sizes up to 10x10 mm)
Available Measurement Modes AC Field Hall & DC Field Hall (Versatile characterization)
Gate Voltage Integration Software-controlled Gate Bias (Optional upgrade)
Primary Extracted Parameters Carrier Concentration, Mobility, Sheet Resistance
Operating Software Suite Proprietary Semilab UI / Advanced Signal Processing
System Form Factor Compact Tabletop Configuration (Space-saving design)
Signal Extraction Technique High S/N Lock-in extraction & Background subtraction
Material Compatibility PV absorbers, Thermoelectrics, Wide Bandgap Semiconductors

Application

Photovoltaic Research

Characterizing low-mobility absorbers such as Perovskites, CIGS, and CZTS, as well as evaluating the uniformity and electronic quality of Transparent Conductive Oxides (TCOs).

Semiconductor Analysis

Investigating the electronic transport properties of wide-bandgap materials (GaN, SiC) and high-resistance oxide semiconductors used in advanced TFT and power electronics.

Thermoelectric Materials

Measuring carrier concentration and mobility in high-efficiency thermoelectric materials to optimize the power factor and overall figure of merit (ZT) for energy harvesting.

System Highlights

High Peak-to-Peak Field Performance
The Parallel Dipole Line system generates a substantial 2.5 T peak-to-peak field. This high field strength is critical for inducing a detectable Hall voltage in samples where carrier movement is severely restricted, ensuring data reliability across a wide range of material classes.
Exceptional Field Uniformity Control
By maintaining less than 2% field deviation across a 10x10 mm area, the PDL-1000 ensures that the magnetic flux experienced by the sample is consistent. This eliminates errors caused by field gradients, providing researchers with highly repeatable and precise electronic data.

Key Benefits

Characterize "Impossible" Low-Mobility Samples
Unlock new research opportunities by accurately measuring materials with mobility below 0.1 cm²/Vs. The PDL-1000 succeeds where standard DC systems fail, providing critical insights into emerging electronic and energy materials.
Streamlined Laboratory Workflow Automation
Reduce complexity and manual effort with automated parameter extraction and built-in diagnostic tools. The tabletop design allows for high-sensitivity characterization without the need for specialized cryogenic or high-power infrastructure.
Enhanced Signal Integrity for High-Quality Data
Proprietary signal processing and lock-in techniques provide publication-ready data with high confidence. By effectively isolating the Hall signal from thermal and parasitic noise, the system ensures the accuracy of every calculation.
Versatile Multi-Mode Characterization Options
Switch seamlessly between AC and DC modes to accommodate a diverse sample portfolio. Whether characterizing ultra-thin films, high-resistance semiconductors, or metallic layers, the PDL-1000 adapts to your specific research needs.