HIOKI RESISTANCE METER RM3542C
High-precision resistance meter for automated in-line testing of chip resistors and ferrite beads
The RM3542C is a DC resistance meter for automated in-line inspection of chip resistors and ferrite beads. On-instrument ΔR compares process-to-process change, while BIN grading (up to 7 bins) delivers instant pass/fail and ranking. Jumper-resistor assist speeds low-resistance screening. ≤5 V low-stress measurement and continuous contact monitoring secure reliability. Optimized ranges and a galvanic isolation architecture keep results stable on noisy lines, enabling stricter inspection with higher throughput.
| RM3542C-1 | Standard model |
|---|---|
| RM3542C-2 | Standard model (GP-IB compatible) |
| RM3542C-3 | Advanced model |
Jumper Resistance Measurement Support (Jumper Mode) skips the slower, high-accuracy measurement ranges at or below 100 mΩ, shortening inspection time by 76%. Keeps your production throughput high.
Example: inspect a 100 mΩ jumper resistor (zero-ohm resistor) with comparator limits set to 100 mΩ (upper limit) and 50 mΩ (lower limit).
Instrument約 settings
Measurement speed: fast, Delay 2 (time between application start and measurement): 0 ms
BIN Measurement performs judgments and automatic grading into 0-6 categories (up to 7 bins). Reduces system workload and repose time, improving efficiency on production lines with strict takt time requirements.
ΔR Function (cross-stage auto-judgment) automatically compares measurement results from two separate instruments and flags defects when the difference exceeds a threshold. This strengthens inspection reliability and reduces system workload by eliminating manual cross-checks
Integration Time Control lets you assign an integration time to each measurement range to match your production needs—from Fast mode down to 0.9 ms for short takt-time, high-throughput lines, to Slow mode for maximum stability and repeatability. Optimized intermediate ranges (e.g., 3 and 300 Ω) boost S/N ratio, cut variation, and ensure repeatable results. A galvanically isolated architecture minimizes the effect of external electrical interference, delivering stable data in high noise production lines.
Limit applied voltage to 5 V or less (Applied Voltage Limit) to enable safe and accurate testing of micro-components such as 0080004 size resistor. Applying Contact Improvement sequentially to H and L sides suppresses inrush current —preventing characteristics shifts in sensitive parts like ferrite beads.
Operating conditions: set Contact Improvement to “Pulse” and turn on either Low-power Resistance Measurement or Applied Voltage Limiter.
Pre-measurement Contact Improvement (17/25/35/50 mA) stabilizes the probe contact. Continuous Contact Check and Voltage Monitor reduce contact-related misjudgments and the risk of line stoppage.
Preset instantly recalls saved conditions to prevent operator setup errors and keep measurement conditions consistent on multi-product lines. Stage Mismatch Prevention avoids miswiring after calibration or maintenance on dual-meter automated equipment. 90-Day Accuracy* delivers higher measurement accuracy for ultra-tight-tolerance components compared to standard 1-year accuracy—achieving setup repeatability, line stability, and rigorous pass/fail decisions simultaneously. *RM3542C-3 only.
Malaysia
