InSEM HT
Specifically designed for mechanical properties testing at high temperature under vacuum on small volumes of materials, without sacrificing accuracy or cost. The InSEM HT measures hardness, modulus and stiffness at high temperatures by independently heating both the tip and sample in a vacuum environment, with the ability to view real-time deformation.
Product Overview
The InSEM HT is compatible with SEM, Focused Ion Beam (FIB) chambers or standalone vacuum chambers. The system provides independent control of the tip and sample temperatures to maintain minimum thermal drift. The heating system is combined with a high-precision XYZ motion system that provides positioning with sub-5nm resolution using linear optical encoders. The enclosed system facilitates measurement of light-sensitive or environment-sensitive samples.
.png)
Main Features & Capabilities
High-Temperature Testing
Sample heating up to 800°C with 10mm sample size and vacuum-compatible sample mounting system for mechanical properties testing at elevated temperatures.
Independent Tip & Sample Heating
Independent control of tip and sample temperatures to maintain minimum thermal drift between the indenter tip and the testing sample for accurate measurements.
Continuous Stiffness Measurement
Measures stiffness and other material properties during the indentation cycle. At elevated temperatures, CSM delivers key insight into strain rate sensitivity and creep measurements.
NanoBlitz 3D Mapping
Quickly and quantitatively maps surface mechanical properties, generating thousands of data points for statistically significant results on rough or heterogeneous materials.
Precision Motion System
High-precision XYZ motion system provides positioning with sub-5nm resolution using linear optical encoders for accurate sample targeting.
Tip Calibration System
Unique software-integrated tip-calibration system for fast, accurate tip calibration with interchangeable tips for InForce 50 and InForce 1000 actuators.
Description & Key Benefits
System Specifications
| Category | Technical Parameter | Specification Detail |
|---|---|---|
| Thermal | Maximum Temperature | 800°C |
| Mechanical | Force Actuator | InForce 50 (50 mN) / InForce 1000 (1000 mN) |
| Electronics | Data Acquisition Rate | 100 kHz |
| Electronics | Time Constant | 20 µs |
| Positioning | Motion Resolution | <5 nm (XYZ linear optical encoders) |
| Sample | Maximum Sample Size | 10 mm |
| Compliance | Standard | ISO 14577 |

Versatile Applications
High-Temperature Materials Research
Characterization of material performance at elevated temperatures for understanding deformation mechanisms and phase transformations.
Hardness & Modulus Measurement
Oliver-Pharr method for hardness and modulus determination at high temperatures on small volumes of materials.
Creep Measurement
Evaluation of time-dependent deformation at elevated temperatures with depth-time curves showing significant creep starting at ~200°C.
Strain Rate Sensitivity
Measurement of strain rate sensitivity at high temperatures using CSM for insight into material rate-dependent behavior.