iNano
Flexible, easy-to-use mechanical testing for a wide range of applications and materials. The iNano is a compact, user-friendly nanomechanical measurement system designed for hard coatings, thin films, and small volumes of materials. With a large dynamic range of force and displacement, the iNano can exert up to 50mN of force to test thin films and soft materials.
Product Overview
The iNano comes with a wide variety of standard test protocols and can be easily programmed for novel measurements. The iNano design produces calibrations that are stable for years, ensuring consistent measurement data from multiple instruments across multiple sites. The system has a small footprint to conserve lab space and conforms to ISO 14577 to ensure data integrity. The proprietary InView software suite includes RunTest with on-screen controls, ReviewData for data analysis, and InFocus for generating graphs and reports.
Main Features & Capabilities
InForce 50 Actuator
Interchangeable tips for capacitance displacement measurement and electromagnetic force actuation up to 50mN, ideal for thin films and soft materials with fast, accurate tip calibration.
Continuous Stiffness Measurement
Measures stiffness and other material properties during the indentation cycle as a function of depth, force, time, or frequency with constant strain rate capability.
NanoBlitz 3D Mapping
Quickly and quantitatively maps surface mechanical properties by generating thousands of data points in a short period, assessing microstructure differences and property gradients.
AccuFilm Thin Film Method
Characterizes ultra-thin films by correcting for substrate influence using the Hay-Crawford model for measuring hard films on soft substrates or soft films on hard substrates.
ProbeDMA Local DMA
Enables dynamic mechanical analyses on soft polymers by measuring storage modulus, loss modulus, and loss factor as a function of frequency using the CSM module.
Scratch and Wear Testing
Applies constant or ramped load to an indenter tip as it moves across the sample surface for characterizing thin films, brittle ceramics and polymers.
Description & Key Benefits
System Specifications
| Category | Technical Parameter | Specification Detail |
|---|---|---|
| Mechanical | Maximum Force | 50 mN |
| Actuator Type | InForce 50 with interchangeable tips | |
| Transducer | Electromagnetic with capacitive sensor | |
| Measurement | CSM | Continuous Stiffness Measurement (optional) |
| Thermal | Max Sample Temperature | 300°C with uniform heating chamber |
| Compliance | Standard | ISO 14577 |
| Software | Platform | InView (RunTest, ReviewData, InFocus) |
| Vibration | Isolation | Passive built-in (active optional) |
Versatile Applications
Manufacturing Quality Control
Automated indentation testing and statistical data analysis for production process validation and material quality assurance.
Semiconductor Wafers & Packaging
Nanomechanical characterization of thin films, low-k dielectrics, and interconnect structures for semiconductor process control.
Polymers & Plastics
Viscoelastic property measurement including storage modulus, loss modulus, and creep response for polymer material development.
Coatings & Paints
Hardness, scratch resistance, and adhesion testing of protective and decorative coating systems.
Batteries & Energy Storage
Mechanical property evaluation of electrode materials, separators, and solid-state electrolyte layers for energy storage devices.
