HCPL-4504-500E

HCPL-4504-500E

Category: Available (Qty:9999999)
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Description

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High CMR, High Speed Optocouplers

Parameter Description Value
Device Type Optocoupler with Integrated Zero-Crossing Detector -
Package DIP-8 -
Operating Temperature Range (TOPR) Operating Temperature of the Device -40°C to +105°C
Storage Temperature Range (TSTG) Storage Temperature of the Device -65°C to +150°C
Input Current (IF) Forward Current of the Input LED 10 mA (Max)
Input Voltage (VIF) Forward Voltage of the Input LED 1.2 V (Typ) at IF = 20 mA
Output Voltage (VCE(sat)) Collector-Emitter Saturation Voltage 0.5 V (Max) at IC = 10 mA, VCE = 5 V
Output Current (IC) Collector Current 10 mA (Max)
Isolation Voltage (VIORM) Isolation Voltage, Rated 5000 VRMS for 1 minute
Zero-Crossing Detection Range Range of AC Input Voltage for Zero-Crossing Detection ±10% of VAC
Response Time (tr) Rise Time 2 μs (Max)
Response Time (tf) Fall Time 2 μs (Max)
Supply Voltage (VCC) Operating Supply Voltage 4.5 V to 20 V
Quiescent Current (ICC) Supply Current 1 mA (Typ) at VCC = 5 V

Instructions:

  1. Power Supply:

    • Connect the supply voltage (VCC) to Pin 8 and ground (GND) to Pin 4.
    • Ensure the supply voltage is within the specified range (4.5 V to 20 V).
  2. Input Connection:

    • Connect the input signal to Pins 1 and 2.
    • The forward current (IF) should not exceed 10 mA.
  3. Output Connection:

    • Connect the load between Pin 5 (Collector) and the positive supply.
    • Connect Pin 6 (Emitter) to ground.
    • Ensure the collector current (IC) does not exceed 10 mA.
  4. Zero-Crossing Detection:

    • The device will trigger the output when the AC input voltage crosses zero.
    • The detection range is ±10% of the AC input voltage.
  5. Isolation:

    • Ensure that the isolation voltage (VIORM) is not exceeded to prevent damage to the device.
  6. Operating Environment:

    • Operate the device within the specified temperature ranges to ensure reliable performance.
  7. Handling:

    • Handle the device with care to avoid static damage.
    • Follow proper soldering techniques to avoid thermal stress.
  8. Testing:

    • Test the device under typical operating conditions to verify correct functionality.
(For reference only)

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