CD4011BCN(MM5611BN)

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Quad 2-Input NAND Buffered B Series Gate; Package: DIP; No of Pins: 14; Container: Rail

Instructions for Use

1. Supply Voltage (V_DD):

   • The CD4011BCN can operate with a supply voltage ranging from 3V to 18V. Ensure that the supply voltage is within this range to avoid damage to the device.

2. Input Voltage Levels (V_IL, V_IH):

   • For an input to be recognized as low (V_IL), it should be less than 1.5V.
   • For an input to be recognized as high (V_IH), it should be greater than 3.5V when V_DD is at its maximum value.

3. Output Voltage Levels (V_OL, V_OH):

   • When the output is low (V_OL), it will be less than 0.4V under a load current of 4mA.
   • When the output is high (V_OH), it will be at least V_DD - 0.1V under a load current of -0.4mA.

4. Leakage Currents (I_IL, I_OL):

   • The input leakage current (I_IL) is typically ±1μA at 5V.
   • The output leakage current (I_OL) is typically ±20μA at 5V and 0V output.

5. Propagation Delay Time (t_pd):

   • The propagation delay time is the time it takes for a change in input to affect the output. At 5V, it is typically 70ns.

6. Power Dissipation (P_D):

   • The maximum power dissipation is 100mW. Ensure that the device does not exceed this limit to prevent overheating and potential failure.

7. Handling Precautions:

   • The CD4011BCN is sensitive to electrostatic discharge (ESD). Handle the device with care and use proper ESD protection measures.
   • Avoid connecting inputs or outputs to voltages outside the specified range.
   • Ensure that all power and ground connections are secure and stable.

8. Storage and Operating Temperature:

   • Store the device in a dry environment to prevent moisture damage.
   • The operating temperature range is typically -40°C to +85°C. Ensure that the device operates within this range to maintain reliability.