CD4023UBE

CD4023UBE

Category: Available (Qty:9999999)
For more information, visit our official website at utsource.us

Description

BUY CD4023UBE https://www.utsource.net/itm/p/1400503.html
Logic IC

Parameter Symbol Conditions Min Typ Max Unit
Supply Voltage VDD - 3 - 15 V
Input Voltage (High Level) VIH - 3.15 - VDD V
Input Voltage (Low Level) VIL - 0 - 0.85 V
Output Voltage (High Level) VOH IO = -1 mA 2.4 - VDD - 0.1 V
Output Voltage (Low Level) VOL IO = 16 mA 0 - 0.05 V
Input Current (High Level) IIH - -1 - 20 μA
Input Current (Low Level) IIL - -1 - 1 μA
Output Current (High Level) IOH VOH = 2.4V -1 - -10 mA
Output Current (Low Level) IOL VOL = 0.4V 4 - 16 mA
Propagation Delay Time tpd VDD = 5V, f = 10 MHz 9 - - ns
Power Dissipation PD - - - 100 mW

Instructions for Use:

  1. Power Supply:

    • Ensure the supply voltage (VDD) is within the range of 3V to 15V.
    • Connect VSS (pin 7) to ground (0V).
  2. Input Signals:

    • For a high-level input (VIH), the voltage should be at least 3.15V or up to VDD.
    • For a low-level input (VIL), the voltage should be between 0V and 0.85V.
    • Ensure input currents do not exceed the specified limits.
  3. Output Signals:

    • The output voltage (VOH) when high should be at least 2.4V and can go up to VDD - 0.1V.
    • The output voltage (VOL) when low should be no more than 0.05V.
    • Ensure output currents do not exceed the specified limits.
  4. Propagation Delay:

    • The propagation delay time (tpd) is typically 9ns at a supply voltage of 5V and a frequency of 10 MHz.
  5. Power Dissipation:

    • The maximum power dissipation (PD) is 100mW. Ensure the device is not operated beyond this limit to avoid damage.
  6. Handling:

    • The CD4023UBE is sensitive to electrostatic discharge (ESD). Handle with care and use appropriate ESD protection measures.
  7. Storage:

    • Store in a dry environment and avoid exposure to extreme temperatures.
  8. Soldering:

    • Use a soldering iron with a temperature setting appropriate for plastic ICs. Avoid overheating which can damage the device.
(For reference only)

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