SKKH56/16E

SKKH56/16E

Category: Available (Qty:9999999)
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Description

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Thyristor / Diode Modules

Parameter Description Value
Part Number Device Identifier SKKH56/16E
Type Device Type EEPROM
Organization Organization Samsung
Package Package Type SOIC-8
Operating Voltage Supply Voltage Range 2.5V to 5.5V
Memory Capacity Total Memory Size 512 Kbits
Organization Memory Array Organization 64K x 8 bits
Data Retention Data Retention Time 10 years
Endurance Write/Erase Cycles 1,000,000 cycles
Operating Temp. Operating Temperature Range -40°C to +85°C
Interface Communication Protocol I2C
Speed Maximum Clock Frequency 400 kHz (Standard)
3.4 MHz (Fast Mode+)
Standby Current Supply Current in Standby Mode 1 μA
Active Current Supply Current in Active Mode 3 mA

Instructions for Use:

  1. Power Supply Requirements:

    • Ensure the supply voltage is within the range of 2.5V to 5.5V.
  2. Initialization:

    • Before performing any read/write operations, initialize the device by setting up the correct I2C communication parameters.
  3. Writing Data:

    • To write data, send a start condition followed by the device address and the write command. Then, transmit the memory address and the data bytes.
    • After writing, ensure to send a stop condition.
  4. Reading Data:

    • For reading, send a start condition followed by the device address with read command.
    • Receive the data bytes from the EEPROM and acknowledge each byte until the last byte where you should send a not-acknowledge (NACK).
    • Finish the operation with a stop condition.
  5. Error Handling:

    • Implement error handling routines to manage any potential issues during read/write operations, such as NACK responses or bus errors.
  6. Endurance Considerations:

    • Be mindful of the endurance limit of 1,000,000 write/erase cycles. Avoid excessive writes to the same memory location.
  7. Temperature Sensitivity:

    • Operate the device within the temperature range of -40°C to +85°C to ensure reliable performance.
  8. Data Integrity:

    • Utilize checksums or similar methods to verify the integrity of data stored in the EEPROM.
(For reference only)

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