Description
BUY SKKH56/16E https://www.utsource.net/itm/p/3471.html
Thyristor / Diode Modules
Parameter |
Description |
Value |
Part Number |
Device Identifier |
SKKH56/16E |
Type |
Device Type |
EEPROM |
Organization |
Organization |
Samsung |
Package |
Package Type |
SOIC-8 |
Operating Voltage |
Supply Voltage Range |
2.5V to 5.5V |
Memory Capacity |
Total Memory Size |
512 Kbits |
Organization |
Memory Array Organization |
64K x 8 bits |
Data Retention |
Data Retention Time |
10 years |
Endurance |
Write/Erase Cycles |
1,000,000 cycles |
Operating Temp. |
Operating Temperature Range |
-40°C to +85°C |
Interface |
Communication Protocol |
I2C |
Speed |
Maximum Clock Frequency |
400 kHz (Standard) |
|
|
3.4 MHz (Fast Mode+) |
Standby Current |
Supply Current in Standby Mode |
1 μA |
Active Current |
Supply Current in Active Mode |
3 mA |
Instructions for Use:
Power Supply Requirements:
- Ensure the supply voltage is within the range of 2.5V to 5.5V.
Initialization:
- Before performing any read/write operations, initialize the device by setting up the correct I2C communication parameters.
Writing Data:
- To write data, send a start condition followed by the device address and the write command. Then, transmit the memory address and the data bytes.
- After writing, ensure to send a stop condition.
Reading Data:
- For reading, send a start condition followed by the device address with read command.
- Receive the data bytes from the EEPROM and acknowledge each byte until the last byte where you should send a not-acknowledge (NACK).
- Finish the operation with a stop condition.
Error Handling:
- Implement error handling routines to manage any potential issues during read/write operations, such as NACK responses or bus errors.
Endurance Considerations:
- Be mindful of the endurance limit of 1,000,000 write/erase cycles. Avoid excessive writes to the same memory location.
Temperature Sensitivity:
- Operate the device within the temperature range of -40°C to +85°C to ensure reliable performance.
Data Integrity:
- Utilize checksums or similar methods to verify the integrity of data stored in the EEPROM.
(For reference only)
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