Product Feature:
lBuilt-in Z-axis linear grating ruler, non-contact Z-axis height measurement;
lDigital imaging and image processing measurement;
lWork in conjunction with data processing system;
lThe bottom light source uses a collimated light source for contour measurement to improve measurement accuracy;
lThe surface of the platform uses a solid anti-scratch coating;
lThe minimum value of X, Y, Z can be switched between 1um and 0.1um, and the data display can be switched between millimeters and inches, supporting hardware linear compensation.
Product Application:
lIt can be used to check the structure of the internal circuit layer of the PCB, the thickness of the copper foil, the quality of the through-hole, etc.;
lIt can observe and analyze the microstructure of the chip, the flatness of the chip surface, the circuit wiring, and the interface conditions of each layer of material;
lIt can be used to observe the color uniformity of the color filter, the pixel arrangement accuracy, and the integrity of the film layer;
lIt can accurately observe the microscopic features of the top of the drill needle, such as the shape of the blade and the wear condition.
 

Product Description

Technical Specification