MOTIC AE2000MET Inverted Microscope

MOTIC AE2000MET Inverted Microscope

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Inverted Metallurgical Microscope

AE2000MET Series

An inverted metallurgical microscope dedicated to the inspection of bulky samples in automotive, machinery, and steel industry. Easily examine large metal pieces or die casting parts for failure analysis, material research, and quality control.

Product Overview

Motic's CCIS® optics provide new Brightfield/Darkfield objectives with Long Working distances for the inspection of massive opaque samples. High quality glasses and anti-reflex coating ensure superb image quality, supported by a robust 3-plate stage for smooth scanning.

Technical Highlights

  • Optical SystemCCIS® Infinity Concept
  • Contrast MethodsBF, DF, POL Contrast
  • Safety FeatureAuto Light Protection

Core Hardware

3-Plate Stage
Scratch-resistant stage with an extended 280x180mm surface and 50x50mm travel range for safe inspection.
Anti-Fungus Treatment
Applied to all parts of the microscope to protect the system from growth in high-humidity industrial environments.

 
Performance Advantages 

Light Protection

Ergonomic mechanism automatically drives down intensity when changing from DF to BF to avoid potential glare for the user.

Massive Sample Support

Inverted design allows for the inspection of large metal pieces and die-casting parts that are too bulky for upright models.

Precision Engineering

Encoded quintuple nosepiece ensures consistent results by communicating objective status to documentation software.

Advanced Optics

CCIS® Infinity objectives with Long Working Distances and anti-reflex coating provide sharp, high-contrast imagery.

Technical Specifications


 

Versatile Applications

Automotive Industry

Failure analysis and inspection of engine blocks and heavy metal components.

Machinery & Steel

Quality control of large die-casting parts and metallurgical research for raw materials.

Failure Analysis

Detailed investigation of opaque massive samples using Brightfield, Darkfield, and POL contrast.

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