300mm Wafer Inspection Microscope, MTM-MX-12R: 马来西亚的首选 Acculinks Systems (M) Sdn Bhd

300mm Wafer Inspection Microscope, MTM-MX-12R

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详情

Anti vibration structure with 6 supports.
Low center of gravity design enhances stability of inspection image.
Color-corrected infinity optic system
Ergonomic 0 p to 35 p tilting binocular to cater for operator with different height
Trinocular port for Camera attachment
High eye point 10x/25mm eyepiece, adjustable diopter
Ergonomic Low front co-axial coarse and fine focus adjustment.
Coarse adjustment distance: 35mm; fine precision: 0.001mm.
Inward facing nosepiece for less handling obstruction
Motorized 6 objectives changer
Wide range of objectives : 5X, 10X, 20X, 50X, and 100X.
Brightfield, darkfield, DIC, Polarization inspection techniques
Neutral filter and R, G, B color filter
12V 100W reflected light
3 layers working stage with clutch control for quick movement.
XY travel : 305mm x356mm