Bowman XRF Coating Thickness Measurement System

Bowman XRF Coating Thickness Measurement System

分类: ANALYZER 当前有货
欲了解更多详情,请游览我们的官方网站 microx.com.my

详情

Bowman X-Ray Fluorescence XRF Plating Measurement 

XRF instruments use X-ray fluorescence technology to determine the thickness and composition of plating deposits with exceptional accuracy. Measurement is performed by exposing a precisely defined area of the test specimen to x-ray energy. This causes X-ray emission (fluorescence) from both coating and substrate, which is detected with a high precision energy-dispersive detector. Energy resolution, detection efficiency, and robustness are three factors relative to detectors.


 

Elemental Analysis

Where layers of pure metals or alloys are used to enhance product features, it is important to precisely determine both coating thickness, and the elements in the sample.

Applications for elemental analysis

更多 Microx Tech Advance Sdn. Bhd. 相关资料
Microx Tech Advance Sdn. Bhd.
Microx Tech Advance Sdn. Bhd. Lab Instruments Supplier Penang, Microscopy & Imaging Systems Malaysia, XRF Analysis Equipment Supply Bukit Mertajam | MicroX Tech Advance Sdn Bhd