Desktop scanning electron microscope with integrated EDS for fast high-resolution imaging, live elemental identification, and lab-friendly SEM analysis without specialized infrastructure. The system delivers fast, high-resolution imaging together with a fully integrated energy dispersive spectroscopy detector for robust, effortless, and versatile elemental analysis. It is designed to offload routine work from floor-model SEM instruments while enabling users of any experience level to start producing high-quality results quickly. The instrument configuration and sample loading mechanism support quick imaging with minimal time spent tuning between experiments. High-resolution imaging is performed at the same working distance as EDS analysis, which creates a faster and more efficient imaging and elemental analysis workflow. Its long-lifetime CeB electron source offers high brightness with low maintenance, while the system’s high stability and compact footprint make it suitable for practically any lab environment without specialized infrastructure or expert oversight. This makes the Phenom ProX G7 an ideal solution for research labs, shared facilities, advanced teaching environments, and routine SEM-EDS analytical workflows. Provides rapid SEM imaging with strong resolution performance and minimal tuning time between experiments for efficient everyday analytical work. Supports live elemental identification through point-and-click X-ray analysis, plus optional EDS line scan and EDS fast mapping through the integrated EID workflow. High-brightness CeB source delivers long operating life, low maintenance, intelligent hibernation when not in use, and on-site replacement when needed. Compact, stable system design allows installation in practically any laboratory without specialized infrastructure or dedicated expert oversight. The Phenom ProX G7 Desktop SEM is built to expand research facility capabilities by bridging the space between light microscopy and conventional floor-model SEM platforms. It can relieve the burden of routine analysis from larger SEM systems while still delivering fast, high-quality SEM imaging and elemental characterization. Thanks to the design of the SEM column, users can perform high-resolution imaging at the same working distance as EDS analysis. This reduces workflow interruptions and enables faster switching between imaging and elemental identification. Projects can be stored locally or on the network for later or offline analysis. The system is easy to learn and easy to use. Facility users of any experience level can quickly begin producing results, making the platform highly suitable for shared research environments, educational labs, failure analysis groups, and routine industrial microscopy workflows. The dedicated Element IDentification (EID) software package controls the fully integrated EDS detector and makes elemental analysis as easy as imaging. There is no need to switch between external software packages or computers, which simplifies data collection and improves routine usability. The EID software can identify nearly all materials in the periodic table, from boron (5) to californium (98). It uses smart algorithms with advanced peak analysis to optimize automatic identification while still allowing manual adjustments at any point in the analysis process. Optional element mapping and line scan functions allow more advanced EDS analysis through full spectrum mapping, offline post-processing, offline element selection, and re-quantification. These tools help extend the Phenom ProX G7 beyond routine point analysis into more advanced analytical workflows. The standard detector is a four-segment backscattered electron detector that yields sharp images and provides topographical contrast information. An optional Everhart Thornley secondary electron detector reveals detailed surface-layer information and supports live mixing of BSE and SE images to combine compositional and topographic data. Supports imaging in transmission mode with the scanning transmission electron microscopy sample holder for added analytical flexibility. The intelligent software hibernates the CeB source when the system is not in use, extending lifetime and enabling predictable maintenance. Ideal for relieving floor-model SEM systems by handling fast routine imaging and everyday sample analysis in shared facilities and research labs. Integrated EDS enables live elemental identification, advanced elemental mapping, and line scan workflows for material insight and rapid X-ray analysis. Optional SED is especially useful when microstructures, nanostructures, particles, and detailed sample surface morphology are important. Compact footprint, fast sample loading, easy software workflow, and low-maintenance source design support practical high-throughput lab use.
Phenom ProX G7 Desktop SEM with EDS
Product Overview
Phenom ProX G7 is a seventh-generation desktop SEM with integrated EDS capability designed to fill the gap between light microscopy and floor-model SEM analysis while expanding the capabilities of research facilities.
Key Specifications
Main Features
Fast High-Resolution Imaging
Integrated EDS Analysis
Long-Life CeB Source
Lab-Friendly Setup
Optimized Product Content
Key Benefits
Imaging Specifications
EDS & Element Identification Workflow
Optional EDS Mapping & Line Scan
Detector & Source Options
Standard BSD Detector
Optional SED Detector
Transmission Mode Imaging
Scheduled Maintenance Design
System Specifications
Application Focus
Routine Research Imaging
Elemental Analysis
Topography & Morphology Studies
Efficient Lab Operation
Malaysia
