Hioki PCB and substrate inspection equipment leverages our core competency in high precision component testing. The FA1240 series is a 4-arm populated board inspection tool that delivers multi-functional testing in as fast as 0.025 sec./step.
	 
Key Features
	• Quickly complete programs that take into account component height
	• Automatically calculate arm interference (when used with the UA1780)
	• Designed to improve probe replaceability, dramatically reducing system downtime caused by probe replacement
	• High-speed testing at up to 0.025 sec./step
	• Detect IC lead float and pseudo-contact states
	• Support for active testing (optional feature)
	• High-precision probing
	• Large testing area of 510 × 460 mm (FA1240-61)
	• Standard transport capability
	• Automatic alignment function and simple visual test function