74LS28: Top Choice in United States (USA) Utsource Holding Company Limited

Description

Parameter	Description	Value	Unit
Power Supply Voltage (V_CC)	Operating voltage range	4.75 to 5.25	V
Output High Level Voltage (V_OH)	Minimum output high level voltage at I_OH = -0.4 mA	2.4	V
Output Low Level Voltage (V_OL)	Maximum output low level voltage at I_OL = 16 mA	0.4	V
Input High Level Voltage (V_IH)	Minimum input high level voltage	2.0	V
Input Low Level Voltage (V_IL)	Maximum input low level voltage	0.8	V
Propagation Delay Time (t_pd)	Typical propagation delay time	9	ns
Power Dissipation (P_D)	Maximum power dissipation per package	100	mW
Operating Temperature Range (T_A)	Ambient temperature range for operation	0 to 70	°C
Storage Temperature Range (T_STG)	Temperature range for storage	-65 to 150	°C

Power Supply:
- Ensure the power supply voltage is within the specified range of 4.75V to 5.25V.
- Connect the V_CC pin to the positive supply and GND to the ground.
Input Signals:
- Apply input signals that meet the V_IH and V_IL specifications to ensure proper logic levels.
- Avoid applying voltages outside the V_CC range to the inputs to prevent damage.
Output Signals:
- Ensure that the load connected to the outputs does not exceed the maximum current ratings.
- Use pull-up or pull-down resistors as needed to maintain stable logic levels.
Propagation Delay:
- Account for the typical propagation delay of 9 ns when designing timing-sensitive circuits.
Temperature Considerations:
- Operate the device within the specified ambient temperature range of 0°C to 70°C.
- Store the device in an environment with temperatures between -65°C and 150°C.
Handling:
- Handle the device with care to avoid static discharge, which can damage sensitive components.
- Follow standard ESD (Electrostatic Discharge) precautions during handling and assembly.
Mounting:
- Ensure proper mounting and soldering techniques to avoid mechanical stress on the device.
- Use appropriate heat sinks if necessary to manage thermal dissipation.
Testing:
- Test the device under controlled conditions to verify its functionality before integrating it into a larger system.

(For reference only)