SN74HC192N

SN74HC192N

Category: Elec-component Available (Qty:9999999)
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Description

BUY SN74HC192N https://www.utsource.net/itm/p/144128.html
QUADRUPLE 2-INPUT POSITIVE-NAND GATES

Parameter Symbol Conditions Min Typ Max Unit
Supply Voltage VCC Operating 2.0 4.5 6.0 V
Input Low Voltage VIL VCC = 4.5V 0.8 - - V
Input High Voltage VIH VCC = 4.5V - - 3.5 V
Output Low Voltage VOL IOL = 4mA, VCC = 4.5V 0.4 - - V
Output High Voltage VOH IOH = -0.4mA, VCC = 4.5V - - 4.1 V
Input Leakage Current IIL VIN = 0V -1 - 1 μA
Output Leakage Current IOL VOUT = 0V -1 - 1 μA
Propagation Delay Time tpd VCC = 4.5V, TA = 25°C 12 18 24 ns
Power Dissipation PD Continuous - - 100 mW
Operating Temperature Range TA Commercial 0 - 70 °C
Storage Temperature Range TSTG -65 - 150 °C

Instructions for Use:

  1. Power Supply:

    • Ensure the supply voltage (VCC) is within the specified range (2.0V to 6.0V).
    • Connect the ground (GND) pin to a stable 0V reference.
  2. Input Signals:

    • Input signals should be within the valid input voltage range (VIL to VIH).
    • Avoid applying voltages outside the VCC range to input pins to prevent damage.
  3. Output Signals:

    • Ensure that the load connected to the output pins does not exceed the maximum current ratings.
    • Check the output voltage levels (VOL and VOH) to ensure proper logic levels.
  4. Propagation Delay:

    • Account for the propagation delay time (tpd) when designing timing-sensitive circuits.
  5. Temperature Considerations:

    • Operate the device within the specified temperature range (0°C to 70°C for commercial grade) to ensure reliable performance.
    • Store the device within the storage temperature range (-65°C to 150°C).
  6. Handling:

    • Handle the device with care to avoid static discharge, which can damage the internal circuits.
    • Use appropriate ESD protection measures during handling and assembly.
  7. Testing:

    • Test the device under typical operating conditions to verify its functionality.
    • Refer to the datasheet for detailed test procedures and recommended test setups.
(For reference only)

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