EDX3600H X-ray Fluorescence Spectrometer
The EDX3600H is an all-in-one XRF spectrometer capable of virtually any elemental application. Engineered with a best-in-class UHRD or SDD detector and an advanced vacuum system, it delivers complete elemental analysis from Sodium (Na) to Uranium (U) across multiple testing types including Minerals, Alloys, RoHS, and Plating Thickness.
Product Overview
Standard Configuration
- Detector Electronic cooling UHRD
- Light Source Super-thin window X-ray tube
- Visuals CMOS HD Camera
- Enhancement Signal-to-Noise Enhancer (SNE)
- Protection Triple X-Ray Protection
- Automation Collimators and Filters
Key Features
Advanced Vacuum System
Equipped with a high-efficiency vacuum pump to enhance sensitivity for light elements and ensure an optimal testing environment.
UHRD/SDD Detection
Best-in-class detectors provide ultra-high resolution and sensitivity for precise elemental quantification across a wide range of matrices.
Safety & Protection
Triple X-Ray protection design ensures operator safety while maintaining high-throughput non-destructive testing capabilities.
HD Sample Imaging
Built-in CMOS HD camera allows for real-time sample visualization and accurate alignment of the testing spot.
Technical Specifications
| Category | Technical Parameter | Specification Detail |
|---|---|---|
| Measurement Range | Atomic Range | Sodium (Na) to Uranium (U) |
| Detection Limit | Analytical Range | 1ppm to 99.99% |
| Accuracy | Measurement Error | 0.05% (for content above 96%) |
| Sample Types | Physical State | Solid, Powder, Liquid |
| X-ray Tube | Voltage / Current | 5KV - 50KV / 1uA - 1000uA |
| Collimator | Manual/Auto | 8 Sets of Automatic Collimators |
| Filters | Selection | 5 Sets of Automatic Filters |
| Detector | Resolution | UHRD (Ultra-High Resolution Detector) |
| Safety | Radiation Protection | Triple Shielding / Software Interlocks |
| Environment | Operating System | Advanced Vacuum with Auto-control |
Performance Highlights
Applications
Alloy Analysis
Precise identification of grades and elemental composition in non-ferrous and ferrous metals.
RoHS/WEEE
Screening for restricted substances in electronics and consumer goods compliance.
Mineral & Mining
Elemental mapping and quantification for exploration and processing of mineral ores.
Plating Thickness
Non-destructive measurement of coating layers and plating depth on diverse substrates.