Multi Measuring System Coating Thickness Guage

Multi Measuring System Coating Thickness Guage

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Deskripsi

MMS LS Coating Thickness Measure System
Ultra Thin coating thickness tester

Test ultra-thin coating thickness below 10μm
Eddy current measuring principle
Measure the anodic oxide layer thickness on aluminum
Measuring range: 0-1500μm

LS225+N1500/ N2000  is a split type plating thickness tester, which consists of the host and the digital probe N1500. It adopts the eddy current induction principle and has ultra-high measurement accuracy and repeatability which is especially suitable for measuring ultra-thin coatings and various small-sized work pieces and special-shaped materials.


Multiple Type's of Probe

Hard Probe 

Feature

 

LS225 Plating thickness tester host parameters

Parameter Value
Display 240×160 dot matrix LCD
Power supply 4pcs of 1.5V AAA alkaline battery
Operation temperaturerange 0℃-50℃
Storage temperaturerange -20℃-60℃
Host size 148*76*26 mm (L*W*H)
Weight (include battery) 194g

N1500 probe parameters

Parameter Value
Measuring principle Eddy current
Substrate Non-ferromagnetic metal
Measuring range 0.0-1500μm
Resolution 0.1μm: 0μm - 99.9μm
1μm: 100μm - 999μm
0.01mm: 1.00mm – 1.50mm
Repeatability ≤ ± (0.8%H+0.1μm) Test with fixture, H is the standard value
Accuracy ≤±(2%H+0.3μm) after 5 points calibration, H is the standard value
Unit μm / mil
Measuring interval 0.8s
Minimum measuring area Ø = 7mm
Minimum curvature Convex:1.5mm / Concave:10mm
Minimum substrate thickness 0.05mm
Calibration Support zero reference adjustment and 1 to 5-points calibration
Probe size 110*15 mm (Without connecting cable)
Probe weight 81g

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Microx Tech Advance Sdn. Bhd.
Microx Tech Advance Sdn. Bhd. Lab Instruments Supplier Penang, Microscopy & Imaging Systems Malaysia, XRF Analysis Equipment Supply Bukit Mertajam | MicroX Tech Advance Sdn Bhd