Versatile large-sample desktop SEM for automated quality control, fast high-throughput imaging, optional EDS elemental analysis, optional SED surface imaging, and Python-ready workflow automation. The system combines an easy-to-learn interface, fast vent/load operation, large-sample handling, and dependable SEM imaging performance in a desktop format suited to industrial and laboratory environments. It is designed for users who need higher throughput, larger sample support, and more repeatable inspection workflows than smaller desktop SEM platforms can typically offer. The Phenom XL G3 features full-screen images and an average time-to-image of about 40 seconds, helping users move quickly from loading to inspection. Its proprietary venting and loading mechanism is designed for very fast sample exchange, while the integrated interface reduces training time for both new and experienced users. Standard backscattered electron imaging supports sharp images with chemical contrast information, while optional EDS adds elemental analysis and optional SED adds surface-sensitive imaging. With ProSuite applications, Python-based automation through the Phenom Programming Interface, and the optional eucentric sample holder, the Phenom XL G3 is especially well suited for repetitive industrial workflows, particles, pores, fibers, roughness studies, and larger-scale analytical inspection. Automates quality control workflows with accurate, reproducible results and an interface designed to reduce operator training time. Supports samples up to 100 × 100 mm with up to 40 mm height, making it suitable for larger parts, broader scan areas, and more flexible inspection tasks. Standard access through PPI, the Phenom Programming Interface, enables Python scripting for repetitive SEM workflows involving particles, pores, fibers, and large SEM images. Optional EDS, optional SED, ProSuite application support, and the optional eucentric sample holder extend the system for elemental, topographic, and multi-angle analysis. The Phenom XL G3 Desktop SEM is designed to automate the quality control process while maintaining fast, accessible SEM operation. Its all-new user interface uses proven ease-of-use concepts from Thermo Scientific desktop SEM platforms and now integrates analysis workflow, interactive data bars, and overlay controls to simplify operation even further. The platform is ideal for a wide range of applications because it combines a user-friendly operating environment with high throughput, improved large-sample capability, and a reliable backscattered electron imaging system. The standard four-segment BSD yields sharp images and provides chemical contrast information, while the high-sensitivity electron optical detector supports compositional and topographical modes. For facilities that require deeper sample analysis, the ProSuite application platform adds software options such as ParticleMetric, PoroMetric, FiberMetric, and 3D Roughness Reconstruction to extend the Phenom XL G3 beyond basic imaging into more advanced inspection and characterization workflows. The Phenom XL G3 can be equipped with an optional EDS detector for element identification through X-ray analysis. Because high-resolution imaging is performed at the same working distance as EDS analysis, the workflow is faster and easier to manage in routine analytical environments. Live EDS supports immediate point-and-click element identification in imaging mode, while more advanced analysis can be completed through integrated EID tools. The dedicated Element Identification software controls the fully integrated EDS detector without requiring users to switch between separate software packages or computers. Smart algorithms, advanced peak analysis, organized project handling, and manual adjustment options support structured and reliable X-ray analysis. The Phenom XL G3 is standardly accessible through the Phenom Programming Interface for Python-based control of repetitive SEM inspection and analysis tasks. High-brightness CeB source supports detailed imaging, long service life, scheduled maintenance, intelligent hibernation, and on-site replacement when required. The optional eucentric sample holder allows safer and easier tilt and rotation access for viewing the sample from multiple directions in demanding SEM applications. An optional Everhart Thornley secondary electron detector extends the system for surface-sensitive imaging where morphology and topography are critical. Designed for high-throughput, repeatable inspection environments where fast loading, reproducible data, and reduced operator burden are essential. Supports larger parts and broader scan areas for inspection workflows that go beyond the limits of smaller desktop SEM platforms. Well matched to automated workflows involving particles, pores, fibers, and 3D roughness-related applications through ProSuite and Python scripting. Optional EDS supports element identification and mapping, while optional SED supports more surface-sensitive SEM imaging for advanced inspection tasks.
Phenom XL G3 Automated Desktop SEM for Quality Control
Product Overview
Phenom XL G3 is a versatile desktop SEM developed to automate quality control by delivering accurate, reproducible results while freeing up time for value-added work.
Key Specifications
Main Features
Built for Quality Control
Large Sample Handling
Automation Ready
Optional Expanded Capability
Optimized Product Content
Quality Control Benefits
Imaging Specifications
Optional EDS Element Identification
Automation, Source, and Sample Handling
Python Automation via PPI
CeB Long-Life Source
Eucentric Sample Holder Option
Surface-Sensitive SED Option
System Specifications
Optional Mapping & Holder Specifications
Elemental Mapping & Line Scan
Eucentric Sample Holder
Application Focus
Automated Quality Control
Large-Sample Industrial Inspection
Particles, Pores, Fibers & Roughness
Elemental and Surface Analysis
Malaysia
